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Title:Fault Diagnosis of Semiconductor Random Access Memories
Author(s):Thatte, Satish Mukund
Subject(s):Semiconductor random access memories
Functional testing
Pattern sensitivity testing
Issue Date:1977-05
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG 77-2216, R-769
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75169
Sponsor:Joint Services Electronics Program / DAAB-07-72-C-0259
Date Available in IDEALS:2015-04-22
2017-07-14


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