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Title:Concurrent Automatic Test Generation for Delay Faults
Author(s):Niermann, Tom Michael
Issue Date:1989-05
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-89-2213
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75278
Sponsor:SRC 87-DP-109
Date Available in IDEALS:2015-04-22


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