Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B44-CSG_31.pdf (30MB) | (no description provided) |
Description
| Title: | Design of a Bit-Sliced Processor Array with Built-In-Self-Test |
| Author(s): | Mui, Paul Chunhei |
| Subject(s): | Built-in test
Self-test Bit-sliced ALU VLSI circuits |
| Issue Date: | 1984-07 |
| Publisher: | Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. CSG-31 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory |
| URI: | http://hdl.handle.net/2142/75301 |
| Sponsor: | Semiconductor Research Corporation / SRC RSCH 83-01-014 |
| Date Available in IDEALS: | 2015-04-22 2017-07-15 |