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Description
Title: | Design of a Bit-Sliced Processor Array with Built-In-Self-Test |
Author(s): | Mui, Paul Chunhei |
Subject(s): | Built-in test
Self-test Bit-sliced ALU VLSI circuits |
Issue Date: | 1984-07 |
Publisher: | Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. CSG-31 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory |
URI: | http://hdl.handle.net/2142/75301 |
Sponsor: | Semiconductor Research Corporation / SRC RSCH 83-01-014 |
Date Available in IDEALS: | 2015-04-22 2017-07-15 |