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Title:Built-In Tests for VLSI Finite-State Machines
Author(s):Hua, Kien Anh
Issue Date:1984-08
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. CSG-33
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75302
Sponsor:SRC RSCH 83-01-014
Date Available in IDEALS:2015-04-22


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