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Title:New Techniques for Probabilistic Simulation of VLSI CMOS Circuits
Author(s):Stamoulis, Georgios I.
Subject(s):Probabilistic simulation
Reliability
Current density
Electromigration
VLSI CMOS circuits
Issue Date:1991-09
Publisher:Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-91-2246, DAC-30
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75369
Sponsor:U.S. Rome Air Development Center / F30602-88-D0028
Semiconductor Research Corporation / SRC 88-DP-109
Date Available in IDEALS:2015-04-22
2017-07-15


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