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Title:The Derivation of Analytical Design Equations for Built-In Current Sensors for Use in Iddq Testing
Author(s):Greve, David Arthur
Subject(s):Iddq testing
CMOS circuit faults
Built-in current sensor
Quiescent current
Bridging faults
Issue Date:1993-11
Publisher:Analog and Digital Circuits, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-93-2244, DAC-41
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75373
Sponsor:Joint Services Electronics Program / N00014-90-J-1270
Date Available in IDEALS:2015-04-22
2017-07-15


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