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Title:Fault Ordering in Sequential Automatic Test Pattern Generation
Author(s):Heydinger, Scott Michael
Subject(s):Test pattern generation
Faults
Sequential circuits
ATG
Issue Date:1993-01
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-93-2202, CRHC-93-02
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75401
Sponsor:Semiconductor Research Corporation
Date Available in IDEALS:2015-04-22


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