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Description
Title: | Diagnosis of Delay Faults in Sequential Circuits |
Author(s): | Sunder, Srinivas |
Subject(s): | Slow testing
At-speed testing SFCSO MFCSO MFCMO Critical path-tracing Backtracing Fault activation Fault propagation |
Issue Date: | 1995-01 |
Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-95-2202, CRHC-95-02 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
Description: | Coordinated Science Laboratory was formerly known as Control Systems Laboratory |
URI: | http://hdl.handle.net/2142/75412 |
Sponsor: | Semiconductor Research Corporation |
Date Available in IDEALS: | 2015-04-22 2017-07-14 |