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Title:High Level Test Generation Using Software Testing Metrics
Author(s):Johnson, Mark Willard
Issue Date:1995-02
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-95-2204, CRHC-95-06
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75413
Sponsor:Semiconductor Research Corporation
Date Available in IDEALS:2015-04-22


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