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Title:Static Logic Implication with Application to Untestable Fault Identification
Author(s):Zhao, Jian-Kun
Subject(s):Logic implication
ATPG (Automatic Test Pattern Generation)
Redundancy identification
Graph traversal
Transitive reduction
Issue Date:1998-02
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-98-2207, CRHC-98-03
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75438
Sponsor:Semiconductor Research Corp., DARPA, and Hewlett-Packard / 96-DP-109 and DABT63-95-C-0069
Date Available in IDEALS:2015-04-22
2017-07-15


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