Files in this item

FilesDescriptionFormat

application/pdf

application/pdfB60-CRHC_01_06.pdf (31MB)Restricted to U of Illinois
(no description provided)PDF

Description

Title:Test Time and Test Data Volume Reduction Techniques for VLSI Circuits
Author(s):Pandey, Amit Raj
Issue Date:2001-06
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-01-2217
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75466
Sponsor:SRC 99-TJ-717
Date Available in IDEALS:2015-04-22


This item appears in the following Collection(s)

Item Statistics