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Title:Design of Fail-Safe Asynchronous Sequential Machines
Author(s):Fan, Yu-Dar
Subject(s):Fail-safe asynchronous sequential machines
Checkers used for designs
Fail-safe logical gates
Issue Date:1976-01
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG 76-2201, R-713
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory was formerly known as Control Systems Laboratory
URI:http://hdl.handle.net/2142/75565
Sponsor:Joint Services Electronics Program / DAAB-07-72-C-0259
Date Available in IDEALS:2015-04-22


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