Files in this item
Files | Description | Format |
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application/pdf ![]() ![]() | Full Text |
Description
Title: | Test Generation for Microprocessors |
Author(s): | Thatte, Satish Mukund |
Subject(s): | Microprocessor architecture
Architecture models Functional level fault models Test programs Complexity of tests |
Issue Date: | 1979-05 |
Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG 78-2235, R-842 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
Description: | Coordinated Science Laboratory changed its name from Control Systems Laboratory |
URI: | http://hdl.handle.net/2142/75644 |
Sponsor: | Joint Services Electronics Program / DAAB-07-72-C-0259, DAAG-29-78-C-0016, and N00014-79-C-0424 |
Date Available in IDEALS: | 2015-04-22 2017-07-15 |