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Title:Test Generation for Microprocessors
Author(s):Thatte, Satish Mukund
Subject(s):Microprocessor architecture
Architecture models
Functional level fault models
Test programs
Complexity of tests
Issue Date:1979-05
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG 78-2235, R-842
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory changed its name from Control Systems Laboratory
URI:http://hdl.handle.net/2142/75644
Sponsor:Joint Services Electronics Program / DAAB-07-72-C-0259, DAAG-29-78-C-0016, and N00014-79-C-0424
Date Available in IDEALS:2015-04-22


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