Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B32-842.pdf (3MB) | (no description provided) |
Description
| Title: | Test Generation for Microprocessors |
| Author(s): | Thatte, Satish Mukund |
| Subject(s): | Microprocessor architecture
Architecture models Functional level fault models Test programs Complexity of tests |
| Issue Date: | 1979-05 |
| Publisher: | Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG 78-2235, R-842 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| Description: | Coordinated Science Laboratory changed its name from Control Systems Laboratory |
| URI: | http://hdl.handle.net/2142/75644 |
| Sponsor: | Joint Services Electronics Program / DAAB-07-72-C-0259, DAAG-29-78-C-0016, and N00014-79-C-0424 |
| Date Available in IDEALS: | 2015-04-22 |