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Title:Studies of Electron Traps in Gallium Arsenide and Gallium Arsenide Phosphide by Deep Level Transient Spectroscopy
Author(s):Day, Ding-Yuan Samuel
Subject(s):DLTS
Semiconductors
Defects
Issue Date:1980-03
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. R-877
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory changed its name from Control Systems Laboratory
URI:http://hdl.handle.net/2142/75652
Sponsor:Joint Services Electronics Program / N00014-79-C-0424
Office of Naval Research / N00014-76-C-0806
Date Available in IDEALS:2015-04-22


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