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Title:Modeling and Extraction of Interconnect Parameters in Very-Large-Scale Integrated Circuits
Author(s):Yuan, Chen-Ping
Subject(s):Very large scale integrated circuits
Extraction of circuit from layout
Electrical models for interconnect circuit
Issue Date:1983-08
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG 83-2215, R-994
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory changed its name from Control Systems Laboratory
URI:http://hdl.handle.net/2142/75678
Sponsor:Joint Services Electronics Program / N00014-79-C-0424
IBM Corporation
Date Available in IDEALS:2015-04-22


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