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Title:Extraction of MOS VLSI Circuit Models Including Critical Interconnect Parasitics
Author(s):Su, Shun-Lin
Subject(s):Extraction
MOS VLSI
Interconnection
Issue Date:1987-09
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-87-2254
Genre:Report
Type:Text
Language:English
Description:Coordinated Science Laboratory changed its name from Control Systems Laboratory
URI:http://hdl.handle.net/2142/75694
Sponsor:Joint Services Electronics Program / N00014-84-C-0149
Date Available in IDEALS:2015-04-22


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