Properties of Silicon - Silicon-Dioxide Interface States in Thin-Oxide Mos (metal-Oxide Semiconductor) Structures

Eaton, Dennis Hammond
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Title:Properties of Silicon - Silicon-Dioxide Interface States in Thin-Oxide Mos (metal-Oxide Semiconductor) Structures
Author(s):Eaton, Dennis Hammond
Department / Program:Physics
Discipline:Physics
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Physics, Condensed Matter
Issue Date:1972
Type:Text
Language:English
Description:184 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1972.
URI:http://hdl.handle.net/2142/76935
Other Identifier(s):(UMI)AAI7317191
Date Available in IDEALS:2015-05-12
Date Deposited:1972


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