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Description
Title: | Properties of Silicon - Silicon-Dioxide Interface States in Thin-Oxide Mos (metal-Oxide Semiconductor) Structures |
Author(s): | Eaton, Dennis Hammond |
Department / Program: | Physics |
Discipline: | Physics |
Degree Granting Institution: | University of Illinois at Urbana-Champaign |
Degree: | Ph.D. |
Genre: | Dissertation |
Subject(s): | Physics, Condensed Matter |
Issue Date: | 1972 |
Type: | Text |
Language: | English |
Description: | 184 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1972. |
URI: | http://hdl.handle.net/2142/76935 |
Other Identifier(s): | (UMI)AAI7317191 |
Date Available in IDEALS: | 2015-05-12 |
Date Deposited: | 1972 |
This item appears in the following Collection(s)
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Dissertations and Theses - Physics
Dissertations in Physics -
Graduate Dissertations and Theses at Illinois
Graduate Theses and Dissertations at Illinois