Files in this item



application/vnd.openxmlformats-officedocument.presentationml.presentation389754.pptx (1MB)
PresentationMicrosoft PowerPoint 2007


application/pdf1062.pdf (15kB)


Title:The complete, temperature resolved spectrum of methyl formate between 214 and 265 GHZ
Author(s):McMillan, James P.
Contributor(s):De Lucia, Frank C.; Neese, Christopher F.; Fortman, Sarah
Abstract:We have studied methyl formate, one of the so-called "astronomical weeds", in the 214--265 GHz band. We have experimentally gathered a set of intensity calibrated, complete, and temperature resolved spectra from across the astronomically significant temperature range of 248--406 K. Using our previously reported method of analysisfootnote{J.~McMillan, S.~Fortman, C.~Neese, F.~DeLucia, ApJ. 795, 56 (2014)}, the point by point method, we are capable of generating the complete spectrum at an arbitrary temperature. Thousands of lines, of nontrivial intensity, which were previously not included in the available astrophysical catalogs have been found. The sensitivity of the point by point analysis is such that we are able to identify lines which would not have manifest in a single scan across the band. The consequence has been to reveal not only a number of new methyl formate lines, but also trace amounts of contaminants. We show how the intensities from the contaminants can be removed with indiscernible impact on the signal from methyl formate. To do this we use the point by point results from our previous studies of these contaminants. The efficacy of this process serves as strong proof of concept for usage of our point by point results on the problem of the �weeds�. The success of this approach for dealing with the weeds has also previously been reported.footnote{S.~Fortman, J.~McMillan, C.~Neese, S.~Randall, and A.~Remijan, J.~Mol.~Spectrosc. 280, 11 (2012).}
Issue Date:25-Jun-15
Publisher:International Symposium on Molecular Spectroscopy
Citation Info:ACS
Genre:Conference Paper / Presentation
Date Available in IDEALS:2016-01-05

This item appears in the following Collection(s)

Item Statistics