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Title:Automatic Test Generation Techniques for Sequential Circuits
Author(s):Yu, Xiaoming
Doctoral Committee Chair(s):Elizabeth M. Rudnick
Department / Program:Education
Discipline:Education
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Computer Science
Abstract:Finally, a GA-based diagnostic test generation approach is proposed for sequential circuits. A simple GA, which interacts with an efficient diagnostic fault simulator, is proposed to target groups of undistinguished fault pairs iteratively. Efficient data structures are used and heuristics are proposed to seed the initial populations of the GA. Experimental results also demonstrate the efficiency of the proposed method.
Issue Date:2002
Type:Text
Language:English
Description:107 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.
URI:http://hdl.handle.net/2142/79712
Other Identifier(s):(MiAaPQ)AAI3070489
Date Available in IDEALS:2015-09-25
Date Deposited:2002


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