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Title:Measuring the Electronic Structure of Atomically Uniform Silver Films Grown on Silicon Using Angle-Resolved Photoemission Spectroscopy
Author(s):Speer, Nathan James
Doctoral Committee Chair(s):Tai Chiang
Department / Program:Physics
Discipline:Physics
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Physics, Condensed Matter
Abstract:As the film thickness increases, the electronic structure evolves to form the bulk band continuum plus separates surfaces states. A careful analysis of this evolution allows us to separate surface from bulk effects, an important and troubling problem in photoemission spectroscopy. As a result, we are able to clearly identify, for the first time, many surface states buried in the pockets of the d-band manifold that had previously only been theoretically predicted.
Issue Date:2008
Type:Text
Language:English
Description:89 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2008.
URI:http://hdl.handle.net/2142/80585
Other Identifier(s):(MiAaPQ)AAI3337905
Date Available in IDEALS:2015-09-25
Date Deposited:2008


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