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Title:Modeling and Measurements of an Ionized Physical Vapor Depositon Device Plasma
Author(s):Juliano, Daniel Rene
Doctoral Committee Chair(s):Ruzic, David N.
Department / Program:Physics
Discipline:Physics
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Abstract:Third, a computer simulation was used to model the transport of sputtered atoms through the IPVD system. The simulation combines Monte Carlo and fluid methods to track the metal atoms that are emitted from the target, interact with the IPVD plasma, and are eventually deposited somewhere in the system. Ground-state neutral, excited, and ionized metal atoms are tracked. The simulation requires plasma conditions to be specified. The primary product of the simulation is a prediction of the ionization fraction of the sputtered atom flux at the substrate under various conditions. This quantity was experimentally measured and the results compared to the simulation.
Issue Date:2000
Type:Text
Language:English
Description:288 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.
URI:http://hdl.handle.net/2142/80677
Other Identifier(s):(MiAaPQ)AAI9955632
Date Available in IDEALS:2015-09-25
Date Deposited:2000


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