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|Title:||Fluctuation Electron Microscopy of Medium -Range Order in Amorphous Silicon|
|Author(s):||Voyles, Paul Marriner|
|Doctoral Committee Chair(s):||Gibson, J.M.|
|Department / Program:||Physics|
|Degree Granting Institution:||University of Illinois at Urbana-Champaign|
|Subject(s):||Engineering, Materials Science|
|Abstract:||Experiments also show that hydrogenated amorphous silicon deposited by a variety of methods shares the paracrystalline structure. The medium-range order of hydrogenated amorphous silicon is affected by exposure to visible-spectrum white light. Films deposited by different methods have different responses, which may be connected to differences in the creation of metastable electrical defects known as the Staebler-Wronski effect.|
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001.
|Date Available in IDEALS:||2015-09-25|