Files in this item

FilesDescriptionFormat

application/pdf

application/pdf9996700.pdf (9MB)Restricted to U of Illinois
(no description provided)PDF

Description

Title:Fluctuation Electron Microscopy of Medium -Range Order in Amorphous Silicon
Author(s):Voyles, Paul Marriner
Doctoral Committee Chair(s):Gibson, J.M.
Department / Program:Physics
Discipline:Physics
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Materials Science
Abstract:Experiments also show that hydrogenated amorphous silicon deposited by a variety of methods shares the paracrystalline structure. The medium-range order of hydrogenated amorphous silicon is affected by exposure to visible-spectrum white light. Films deposited by different methods have different responses, which may be connected to differences in the creation of metastable electrical defects known as the Staebler-Wronski effect.
Issue Date:2001
Type:Text
Language:English
Description:180 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001.
URI:http://hdl.handle.net/2142/80698
Other Identifier(s):(MiAaPQ)AAI9996700
Date Available in IDEALS:2015-09-25
Date Deposited:2001


This item appears in the following Collection(s)

Item Statistics