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Title:Measurement, Modeling, and Simulation of Fast Transients in ESD Devices
Author(s):Juliano, Patrick Alfred
Doctoral Committee Chair(s):Rosenbaum, Elyse
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Abstract:We also investigated LVTSCR structures fabricated in a commercial CMOS technology, including measuring the turn-on time of LVTSCR ESD protection devices. A circuit simulation macromodel for use in circuit simulation tools has also been incorporated into the Illinois Electrothermal Simulator (iETSIM). A complete discussion of SCRs as ESD protection devices and our measurement/modeling work is given herein.
Issue Date:2001
Type:Text
Language:English
Description:165 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001.
URI:http://hdl.handle.net/2142/80733
Other Identifier(s):(MiAaPQ)AAI3023088
Date Available in IDEALS:2015-09-25
Date Deposited:2001


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