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Title:Ic-Rest(2): A Time-to-Market Driven IC Reliability Statistics Tool
Author(s):Haggag, Amr
Doctoral Committee Chair(s):Hess, Karl
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Abstract:The tool combines TCAD simulation, short-time tests and novel solutions to the SiO2 and Si-SiO2 defect generation rate equations (in time and space) under static and dynamic operation. The predicted failure statistics are best described by the generalized Gamma-distribution (or more accurately the generalized B-distribution) and on a Gumbel plot look more Weibull than Log-normal .
Issue Date:2002
Type:Text
Language:English
Description:85 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.
URI:http://hdl.handle.net/2142/80790
Other Identifier(s):(MiAaPQ)AAI3070314
Date Available in IDEALS:2015-09-25
Date Deposited:2002


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