Files in this item

FilesDescriptionFormat

application/pdf

application/pdf3392208.pdf (2MB)Restricted to U of Illinois
(no description provided)PDF

Description

Title:Methodologies for Broadband Electromagnetic Modeling of on-Chip Semiconductor Substrate Noise
Author(s):Manetas, George
Doctoral Committee Chair(s):Cangellaris, Andreas C.
Department / Program:Electrical and Computer Engineering
Discipline:Electrical and Computer Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Abstract:For a full-wave modeling of the substrate coupling problem the thesis elaborates on a number of features for the time domain finite integration technique (FIT), a volumetric discretization scheme, aimed at improving its computational performance for the type of geometrical characteristics encountered in substrate coupling problems on-chip. Along these lines, the implicit Newmark-beta scheme is proposed as the time-marching scheme to overcome the severe restrictions on the maximum stable time step imposed by stability constraints to the more frequently used explicit leapfrog scheme. Furthermore, a previously proposed FDTD subgridding scheme, based on a finite element method (FEM) formalism, has been reformulated and adapted to work within the FIT framework. One important element of the presented subgridding scheme is that it maintains the transpose property between the discrete curl operators for electric and magnetic fields. This is a key ingredient for the implementation of a global discrete system that is energy conserving, consistent with the modeled continuous problem; hence any subgridding induced, late time instabilities are avoided.
Issue Date:2009
Type:Text
Language:English
Description:101 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.
URI:http://hdl.handle.net/2142/81144
Other Identifier(s):(MiAaPQ)AAI3392208
Date Available in IDEALS:2015-09-25
Date Deposited:2009


This item appears in the following Collection(s)

Item Statistics