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Title:State Information-Based Solutions for Sequential Circuit Diagnosis and Testing
Author(s):Boppana, Vamsi
Doctoral Committee Chair(s):Fuchs, W. Kent
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Computer Science
Abstract:Identifying and understanding the capabilities of sequential untestability identification by practical ATPG algorithms is vital to areas such as ATPG-based optimization and ATPG-based verification. This research provides conditions based on the state properties of the good and the faulty machines involved to ensure that the behavior of the circuit in the presence of untestable faults, as identified by practical sequential ATPG algorithms, is not different from the good circuit. This helps alleviate problems faced with the use of such algorithms in applications where inaccuracies in the identified untestabilities are unacceptable.
Issue Date:1997
Type:Text
Language:English
Description:104 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.
URI:http://hdl.handle.net/2142/81201
Other Identifier(s):(MiAaPQ)AAI9812536
Date Available in IDEALS:2015-09-25
Date Deposited:1997


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