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Title:Sequential Circuit Test Generation Using Genetic Techniques
Author(s):Hsiao, Michael Shaun
Doctoral Committee Chair(s):Patel, Janak H.
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Computer Science
Abstract:Finally, synchronizing sequences can greatly benefit test generation. Finding these sequences, however, is nontrivial. The GA is applied to find short synchronizing sequences, and applications of these sequences are also discussed.
Issue Date:1997
Type:Text
Language:English
Description:108 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.
URI:http://hdl.handle.net/2142/81208
Other Identifier(s):(MiAaPQ)AAI9812627
Date Available in IDEALS:2015-09-25
Date Deposited:1997


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