Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  9812660.pdf (6MB) | (no description provided) |
Description
| Title: | Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation |
| Author(s): | Krishnaswamy, Dilip |
| Doctoral Committee Chair(s): | Banerjee, Prithviraj; Janak Patel |
| Department / Program: | Electrical Engineering |
| Discipline: | Electrical Engineering |
| Degree Granting Institution: | University of Illinois at Urbana-Champaign |
| Degree: | Ph.D. |
| Genre: | Dissertation |
| Subject(s): | Mathematics |
| Abstract: | All implementations were done using the MPI communication library and are therefore portable to many parallel platforms. All algorithms provide excellent performance in terms of speedup and quality on both shared-memory and distributed-memory parallel platforms. |
| Issue Date: | 1997 |
| Type: | Text |
| Language: | English |
| Description: | 110 p. Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997. |
| URI: | http://hdl.handle.net/2142/81212 |
| Other Identifier(s): | (MiAaPQ)AAI9812660 |
| Date Available in IDEALS: | 2015-09-25 |
| Date Deposited: | 1997 |
This item appears in the following Collection(s)
-
Dissertations and Theses - Electrical and Computer Engineering
Dissertations and Theses in Electrical and Computer Engineering -
Graduate Dissertations and Theses at Illinois
Graduate Theses and Dissertations at Illinois