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Title:Simulation- and Deduction-Based Techniques for Fault Diagnosis
Author(s):Venkataraman, Srikanth
Doctoral Committee Chair(s):Fuchs, W. Kent
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Computer Science
Abstract:Finally, an integrated technique that uses a combination of static and dynamic processing for the diagnosis of bridging faults in sequential circuits is presented. During diagnosis, the failing outputs from the test are used to adaptively determine the behavior of the bridge at each time-frame. Selective faulty state information is stored by performing accurate bridging fault simulation once before diagnosis. During diagnosis, the state information is used to increase the accuracy of diagnosis. The combination of adaptive simulation, state storage, and path-tracing has low computational requirements.
Issue Date:1997
Description:104 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.
Other Identifier(s):(MiAaPQ)AAI9812798
Date Available in IDEALS:2015-09-25
Date Deposited:1997

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