Files in this item



application/pdf9834658.pdf (6MB)Restricted to U of Illinois
(no description provided)PDF


Title:Models for Yield Estimation of Multichip Module Ceramic Substrates
Author(s):Castano, Rebecca L.
Doctoral Committee Chair(s):Seth Hutchinson
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Engineering, Packaging
Abstract:We present improved yield models that can be used for a broader range of printed patterns. We also enhance the defect geometry models that are commonly used today. We introduce a defect geometry model that is based on the physical process of defect formation. Our defect geometry model employs Markov random fields to represent more general defect shapes. Yield is estimated using Monte Carlo sampling methods. Finally, we present methods for estimating the parameters of the yield models using observed data from the manufacturing process.
Issue Date:1998
Description:129 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.
Other Identifier(s):(MiAaPQ)AAI9834658
Date Available in IDEALS:2015-09-25
Date Deposited:1998

This item appears in the following Collection(s)

Item Statistics