Files in this item

FilesDescriptionFormat

application/pdf

application/pdf9834663.pdf (5MB)Restricted to U of Illinois
(no description provided)PDF

Description

Title:Efficient Testing for Bridging Faults in Digital Integrated Circuits
Author(s):Chen, Tzu-Hao
Doctoral Committee Chair(s):Hajj, Ibrahim N.
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Electronics and Electrical
Abstract:Finally, we present a diagnosis test generation method using an adaptive diagnosis scheme. This approach achieves high diagnostic resolution with few required measurements.
Issue Date:1998
Type:Text
Language:English
Description:122 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.
URI:http://hdl.handle.net/2142/81221
Other Identifier(s):(MiAaPQ)AAI9834663
Date Available in IDEALS:2015-09-25
Date Deposited:1998


This item appears in the following Collection(s)

Item Statistics