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Title:Investigation of the Interface Recombination Velocity of Native Oxide/iii-V Semiconductor Interfaces
Author(s):Curtis, Anthony Paul
Doctoral Committee Chair(s):Stillman, Gregory E.
Department / Program:Electrical Engineering
Discipline:Electrical Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Engineering, Materials Science
Abstract:The activation energy of the IRV was extracted from variable temperature TRPL measurements performed on selected samples. The activation energies of the interface recombination velocities agreed with previously established results on unoxidized material interfaces.
Issue Date:1998
Type:Text
Language:English
Description:144 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.
URI:http://hdl.handle.net/2142/81239
Other Identifier(s):(MiAaPQ)AAI9904427
Date Available in IDEALS:2015-09-25
Date Deposited:1998


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