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Title:Measurement-Based Characterization of Parallel I/O Systems
Author(s):Sharma, Sanjay
Doctoral Committee Chair(s):Iyer, Ravishankar K.
Department / Program:Computer Science
Discipline:Computer Science
Degree Granting Institution:University of Illinois at Urbana-Champaign
Degree:Ph.D.
Genre:Dissertation
Subject(s):Computer Science
Abstract:This research addresses the issue of evaluating the performance of parallel I/O subsystems for a variety of I/O intensive workloads on massively parallel systems. First, a model-based workload specification methodology for generating parallel I/O intensive workloads is described. Second, a synthetic workload generator and a performance measurement and monitoring environment based on the synthetic workload generator is described. Finally, the performances of three different kinds of I/O configurations, based on a client/server model, are characterized on two production class parallel file systems. In light of the measurements obtained on two parallel file systems, possible extensions are suggested to improve the overall architecture as well as the parallel file system of the massively parallel systems.
Issue Date:1999
Type:Text
Language:English
Description:137 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1999.
URI:http://hdl.handle.net/2142/81940
Other Identifier(s):(MiAaPQ)AAI9921729
Date Available in IDEALS:2015-09-25
Date Deposited:1999


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