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Title:Quantifying Nanoscale Order in Amorphous Materials via Fluctuation Electron Microscopy
Author(s):Bogle, Stephanie Nicole
Doctoral Committee Chair(s):Abelson, John R.
Department / Program:Materials Science and Engineering
Discipline:Materials Science and Engineering
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Engineering, Materials Science
Abstract:The use of the STEM mode of FEM offers significant advantages in identifying artifacts in the variances. Artifacts, caused by non-idealities in the sample unrelated to nanoscale order, can easily dominate the measured variance, producing erroneous results. We show that reexamination and correction of the contributions of artifacts to variance is necessary to obtain an accurate and quantitative description of the structure of amorphous materials. Using variable resolution FEM we are able to extract a characteristic length of ordered regions in two different amorphous silicon samples. Having eliminated the noise contribution to the variance, we show here the first demonstration of a consistent characteristic length at all values of k. The experimental results presented here are the first to be consistent with both FEM theory and simulations.
Issue Date:2009
Description:63 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2009.
Other Identifier(s):(MiAaPQ)AAI3391887
Date Available in IDEALS:2015-09-25
Date Deposited:2009

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