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Title:Stress and Orientation Effects in Ferroelectric Thin Films
Author(s):Lian, Lei
Doctoral Committee Chair(s):Sottos, Nancy R.
Department / Program:Theoretical and Applied Mechanics
Discipline:Theoretical and Applied Mechanics
Degree Granting Institution:University of Illinois at Urbana-Champaign
Subject(s):Engineering, Materials Science
Abstract:The effects of stress on the response of ferroelectric thin films are measured directly by a beam bending experiment in a unique double-beam laser interferometer. Application of a compressive bending stress to relieve the tensile residual stress in PZT (52/48) film increases the field-induced strains. The opposite effect is observed for application of a tensile stress. To gain further insight into these observations, a previously developed micro-electro-mechanical model is applied to numerically simulate the response of ferroelectrics under a general state of stress and electric field. Material parameters obtained by fitting simulation results with available experimental data are used to predict effects of the preferred crystallographic orientation and biaxial tensile stress applied transverse to the poling direction. The simulation results are consistent with experimental observations of the preferred orientation and stress effects in PZT (52/48) thin films.
Issue Date:2001
Description:139 p.
Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2001.
Other Identifier(s):(MiAaPQ)AAI3017146
Date Available in IDEALS:2015-09-28
Date Deposited:2001

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