Files in this item
Files | Description | Format |
---|---|---|
application/pdf ![]() ![]() | Full Text |
Description
Title: | Symbolic Techniques for VLSI Test and Diagnosis |
Author(s): | Kubiak, Kenneth Edward |
Subject(s): | Testing
Diagnosis Test generation Fault simulation |
Issue Date: | 1994-02 |
Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-94-2207, CRHC-94-06 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/88470 |
Sponsor: | Semiconductor Research Corporation / 93-DP-109 |
Date Available in IDEALS: | 2015-12-10 2017-07-15 |