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Title:Symbolic Techniques for VLSI Test and Diagnosis
Author(s):Kubiak, Kenneth Edward
Subject(s):Testing
Diagnosis
Test generation
Fault simulation
Issue Date:1994-02
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-94-2207, CRHC-94-06
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88470
Sponsor:Semiconductor Research Corporation / 93-DP-109
Date Available in IDEALS:2015-12-10


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