Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B55-UILU-ENG-94-2207-CRHC-94-06_opt.pdf (2MB) | (no description provided) |
Description
| Title: | Symbolic Techniques for VLSI Test and Diagnosis |
| Author(s): | Kubiak, Kenneth Edward |
| Subject(s): | Testing
Diagnosis Test generation Fault simulation |
| Issue Date: | 1994-02 |
| Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-94-2207, CRHC-94-06 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/88470 |
| Sponsor: | Semiconductor Research Corporation / 93-DP-109 |
| Date Available in IDEALS: | 2015-12-10 2017-07-15 |