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Title:A Gate Level Simulator for Alpha-Particle-Induced Transient Faults
Author(s):Cha, Hungse
Subject(s):Transient faults
Alpha-particle-induced
VLSI circuits
Speed
Issue Date:1994-08
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-94-2228, CRHC-94-13
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88473
Sponsor:Office of Naval Research and Joint Services Electronics Program / N00014-90-J-1270
Date Available in IDEALS:2015-12-10


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