Files in this item
Files | Description | Format |
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application/pdf ![]() ![]() | Full text |
Description
Title: | A Gate Level Simulator for Alpha-Particle-Induced Transient Faults |
Author(s): | Cha, Hungse |
Subject(s): | Transient faults
Alpha-particle-induced VLSI circuits Speed |
Issue Date: | 1994-08 |
Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-94-2228, CRHC-94-13 |
Genre: | Report (Grant or Annual) |
Type: | Text |
Language: | English |
URI: | http://hdl.handle.net/2142/88473 |
Sponsor: | Office of Naval Research and Joint Services Electronics Program / N00014-90-J-1270 |
Date Available in IDEALS: | 2015-12-10 2017-07-14 |