Files in this item
| Files | Description | Format |
|---|---|---|
|
application/pdf  B61-UILU-ENG-94-2228-CRHC-94-13_opt.pdf (2MB) | (no description provided) |
Description
| Title: | A Gate Level Simulator for Alpha-Particle-Induced Transient Faults |
| Author(s): | Cha, Hungse |
| Subject(s): | Transient faults
Alpha-particle-induced VLSI circuits Speed |
| Issue Date: | 1994-08 |
| Publisher: | Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign |
| Series/Report: | Coordinated Science Laboratory Report no. UILU-ENG-94-2228, CRHC-94-13 |
| Genre: | Report |
| Type: | Text |
| Language: | English |
| URI: | http://hdl.handle.net/2142/88473 |
| Sponsor: | Office of Naval Research and Joint Services Electronics Program / N00014-90-J-1270 |
| Date Available in IDEALS: | 2015-12-10 2017-07-14 |