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Title:Fault-Sensitivity and Wear-Out Analysis of VLSI Systems
Alternative Title:Fault Sensitivity and Wear-Out Analysis of VLSI Systems
Author(s):Choi, Gwan Seung
Issue Date:1994-07
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-94-2232, CRHC-94-17
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88477
Sponsor:Joint Services Electronics Program
National Aeronautics & Space Administration
Date Available in IDEALS:2015-12-10


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