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Title:Enhancing Testability of VLSI Circuits Using Partial Reset Techniques
Author(s):Mathew, Ben
Subject(s):Computer-aided design
VLSI
Testability schemes
Partial reset
Sequential circuits
Overhead
Unrestricted at-speed
Issue Date:1994-08
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-94-2233, CRHC-94-18
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88478
Sponsor:Semiconductor Research Corp.
Date Available in IDEALS:2015-12-10


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