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Title:Compressed and Dynamic Fault Dictionaries for Fault Isolation
Author(s):Ryan, Paul George
Subject(s):VLSI
Dictionary formats
Compression algorithms
Single-fall fault simulation
Issue Date:1994-09
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-94-2234, CRHC-94-19
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88480
Sponsor:Semiconductor Research Corporation (93-DP-109); Intel Corporation; Joint Services Electronics Program (N00014-90-J-1270)
Date Available in IDEALS:2015-12-10


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