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Title:Fault-Sensitivity and Wear-Out Analysis of VLSI Systems
Author(s):Choi, Gwan Seung
Issue Date:1995-06
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-95-2218, CRHC-95-14
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88487
Sponsor:Joint Services Electronics Program, National Aeronautics & Space Administration, and Office of Naval Research; NASA NAG 1-613 and N00014-90-J-1270
Date Available in IDEALS:2015-12-10
2017-07-15


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