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Title:Sequential Circuit Test Generation Using Genetic Techniques
Author(s):Hsiao, Michael Shaun
Subject(s):Test generation
Genetic algorithms
Test set compaction
Finite state machine
Dynamic state traversal
Issue Date:1997-05
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-97-2213, CRHC-97-09
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88503
Sponsor:Semiconductor Research Corporation / 96-DP-109
Date Available in IDEALS:2015-12-10


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