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Title:Parallel Algorithms for Sequential Circuit Fault Simulation and Test Generation
Author(s):Krishnaswamy, Dilip
Subject(s):Parallel genetic algorithms
Simulation-based parallel test generation
Test set
Sequence partitioning
Synchronous and asynchronous parallel algorithms
Parallel fault simulation
Issue Date:1997-09
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-97-2221, CRHC-97-14
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88505
Sponsor:Semiconductor Research Corporation and ARPA / 96-DP-109 and DAAH04-94-G0273
Date Available in IDEALS:2015-12-10


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