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Title:State Information-Based Solutions for Sequential Circuit Diagnosis and Testing
Author(s):Boppana, Vamsi
Subject(s):Diagnosis
Indistinguishability
DATPG
Partial scan
Untestability
Fault location
Issue Date:1997-12
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-97-2235, CRHC-97-20
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88509
Sponsor:Semiconductor Research Corporation, 96-DP-109
Date Available in IDEALS:2015-12-10


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