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Title:High-Level Testability Analysis and Enhancement for Digital Systems
Author(s):Hsu, Frank Fu-Chang
Subject(s):Design for testability
Test synthesis
Behavioral modification
Partial scan
Variable selection
Issue Date:1998-07
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-98-2216 (CRHC-98-07)
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88511
Sponsor:Semiconductor Research Corp., 97-DJ-482
Date Available in IDEALS:2015-12-10


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