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Title:Automatic Test Generation Techniques for Sequential Circuits
Author(s):Yu, Xiaoming
Subject(s):Sequential circuit test generation
Design for testability
Automatic test generation
Fault generation
Issue Date:2002-09
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-02-2209, CRHC-02-06
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88520
Date Available in IDEALS:2015-12-10


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