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Title:Diagnosis of Delay Faults in Sequential Circuits
Author(s):Sunder, Srinivas
Subject(s):Slow testing
At-speed testing
SFCSO
MFSCO
MFCMO
Critical path-tracing
Backtracing
Fault activation
Fault propagation
Issue Date:1995-01
Publisher:Center for Reliable and High-Performance Computing, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-95-2202, CRHC-95-02
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88551
Sponsor:Semiconductor Research Corporation
Date Available in IDEALS:2015-12-10


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