Browse Dept. of Physics by Subject "Scanning electron microscopy (SEM)"
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Scanning electron microscope technique for measuring electrical conductivity: Application to tetrathiafulvalene-tetracyanoquinodimethane (1977)A new technique for measuring the electrical conductivity of small samples and its application to the organic conductor tetrathiafulvalenetetracyanoquinodimethane (TTF-TCNQ) is reported. A movable current sour(:e provided ...