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Title:A Comprehensive Fault Model for Concurrent Error Detection in MOS Circuits
Author(s):Halperin, Daniel Lee
Subject(s):Concurrent error detection
Fault models
Indeterminate faults
MOS circuits
Physical failure modes
Separable codes
Ternary algebra
Totally self-checking circuits
Issue Date:1983-12
Publisher:Computer Systems Group, Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. CSG-25
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88584
Sponsor:Naval Electronics Sys. Comm. and Office of Naval Research / N00039-80-C-0556
Date Available in IDEALS:2015-12-10


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