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Title:Use of High-level Descriptions in Fault Simulation and Test Generation
Author(s):Chang, Hong-Tao Paul
Subject(s):Fault simulation
Test generation
Functional descriptions
Logic simulation
Issue Date:1987-09
Publisher:Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report:Coordinated Science Laboratory Report no. UILU-ENG-87-2259, CSG-72
Genre:Report
Type:Text
Language:English
URI:http://hdl.handle.net/2142/88598
Sponsor:Semiconductor Research Corporation, 86-12-109 (SRC)
Date Available in IDEALS:2015-12-10


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